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Baugh & Weedon to Showcase Innovation at BINDT NDT 2025 in Edinburgh
Baugh & Weedon is proud to announce participation in the BINDT NDT 2025 Exhibition, taking place in Edinburgh this September.
Visitors will find the team on Stand 26, where a selection of cutting-edge non-destructive testing (NDT) solutions will be on display, including the unique PragmaFlex platform. This innovative solution will also be highlighted as part of the exhibition’s Showcase Day.
In addition to exhibiting, Baugh & Weedon is delighted to contribute to the technical conference programme. On Wednesday 10th September, two members of the team will share their expertise:
- Pete Burrows will present at 14:30 on “Seamless Integration of Phased Array Data with Digital Models using 6DOF Devices”.
- Joshua Aigbotsua will participate in a group presentation at 14:50 on “Advanced Defect Detection and Classification in Sandwich Composite Structures using Statistical and AI-Driven Techniques”.
Baugh & Weedon looks forward to welcoming delegates to Stand 26 to explore its latest solutions and discuss how innovative technologies are shaping the future of NDT.
You can pre-register for free to attend NDT 2025 via this link. https://www.bindt.org/events-and-awards/cm-2025/pre-registration-form/